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PAM-STAMP 2017.5
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PAM-STAMP
2017.5
2017年7月24日
ESI PAM-STAMP 2017.5 release continues with efficiency improvements for the setup and analysis of complete line die simulations. In particular the new gravity fit and the possibility to use very refined meshes with up to 10 million elements for large flexible blanks contribute to achieving a major goal which is removing uncertainty from try-out.
Highlights of the release:
- Efficiency of design reviews
- Usability and capability for advanced materials
- A first version of robustness
- Solver speed up with explicit simulations
- Gravity fit of a sprung blank on the following die
- Cosmetic defects analysis
- Drawbead calibrator with production and explore modes
ESI PAM-STAMP 2017.5.2 - PATCH (released on Dec 07, 2017)
- This patch fixes an important bug on compensation feature. It is highly recommended to install it on top of V2017.5 (especially to run compensation).
View the Release Notes document for more details.
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