Tips & Tricks

Using "Visual Scaling" for Models with Drastically Varying Length Scales
For models that have drastically varying length scales, it can be difficult to create the grid, setup a model, and post-process the results. CFD-GEOM, CFD-ACE-GUI and CFD-VIEW have a "Visual Scale" capability that can significantly help when working with these types of models.
Abraham Meganathan CFD

Parametric Studies Using SimManager
Parametric studies are an important aspect of CFD analysis. Parametric studies are used to perform trend base analyses, optimize the deign of a device, and/or to study the affect of different parameters on a process (What if? type analysis).
Abraham Meganathan CFD

How to Compare the Model Setup Between Two DTF Files
Have you ever wanted to find the differences between two DTF files? If you have, then you will probably be interested in a DTF utility included in your ESI Software installation. The utility is called dtf_diff and can be found in your UTILS_2009.0/bin directory.
Abraham Meganathan CFD

CFD-ACE+ and CFD-TOPO Coupling
There is a growing demand and challenge in different industries, especially semiconductor and MEMS areas, to have increased wafer size with reduced feature size, i.e. high quality process uniformity.
Abraham Meganathan CFD

DTF utility: the -vd and -ud options
The DTF utility offers several options for viewing and manipulating simulation data in a DTF file. Simulation data is essentially all settings that are not Volume Conditions or Boundary Conditions. By using a couple of DTF commands, you can update the data in the DTF file without opening it in CFD-ACE-GUI. In this tip, we will demonstrate how to use the -vd and -ud options of the DTF utility.
Abraham Meganathan CFD

CFD-TOPO: A Tool for Feature Scale Simulation of Semiconductor Processes
CFD-TOPO is a simulation tool that predicts how the shape of entities change due to the combined effects of chemical species transport and surface reactions at gas-solid interfaces. This application provides a wide array of tools to analyze the steps of a semiconductor process on the feature scale of a device (typically the order of micro-meter).
Abraham Meganathan CFD